A Latent Trait Method for Determining Inconsistencies in the Use of the Angoff and Nedelsky Techniques of Standard Setting. Twente Educational Report Number 12 [electronic resource] / Wim J. van der Linden.

It has often been argued that all techniques of standard setting are arbitrary and likely to yield different results for different techniques or persons. This paper deals with a related but hitherto ignored aspect of standard setting, namely, the possibility that Angoff or Nedelsky judges misspecify...

Full description

Bibliographic Details

Online Access:	Full Text (via ERIC)
Main Author:	Linden, Wim J. van der
Corporate Author:	Technische Hogeschool Twente. Department of Education
Format:	Electronic eBook
Language:	English
Published:	[S.l.] : Distributed by ERIC Clearinghouse, 1981.
Subjects:	Error of Measurement. Evaluators. Foreign Countries. Latent Trait Theory. Mathematical Models. Probability. Specifications. Standard Setting (Scoring)