Assessing Inconsistencies in Standard Setting with the Angoff or Nedelsky Technique [electronic resource] / Wim J. van der Linden.

A latent trait method is presented to investigate the possibility that Angoff or Nedelsky judges specify inconsistent probabilities in standard setting techniques for objectives-based instructional programs. It is suggested that judges frequently specify a low probability of success for an easy item...

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Bibliographic Details

Online Access:	Full Text (via ERIC)
Main Author:	Linden, Wim J. van der
Format:	Electronic eBook
Language:	English
Published:	[S.l.] : Distributed by ERIC Clearinghouse, 1982.
Subjects:	Criterion Referenced Tests. Cutting Scores. Error of Measurement. Interrater Reliability. Latent Trait Theory. Mathematical Models. Probability. Secondary Education. Standard Setting (Scoring) Test Items. Test Reliability.