Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

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Bibliographic Details
Online Access:	Full Text (via IEEE)
Main Authors:	Abramovici, Miron (Author), Breuer, Melvin A. (Author), Friedman, Arthur D. (Author)
Format:	eBook
Language:	English
Published:	New York, NY : Hoboken, New Jersey : IEEE ; Wiley-Interscience, [1994]
Edition:	Revised Printing.
Subjects:	Digital integrated circuits > Testing. Digital integrated circuits > Design and construction.

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Full Text (via IEEE)

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Call Number:	TK7874 .A23 1990b
TK7874 .A23 1990b	Available