Interfacial compatibility in microelectronics [electronic resource] : moving away from the trial and error approach / Tomi Laurila [and others]

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Bibliographic Details
Online Access:	Full Text (via Springer)
Other Authors:	Laurila, Tomi
Format:	Electronic eBook
Language:	English
Published:	London ; New York : Springer-Verlag London, ©2012.
Series:	Microsystems (Series)
Subjects:	Microelectronics.

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Full Text (via Springer)

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Call Number:	TK7874 .I58 2012
TK7874 .I58 2012	Available