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Selected etching and annealing properties of Brazilian quartz crystals for solid state track recorder applications [electronic resource]

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Bibliographic Details
Online Access:	Online Access
Corporate Authors:	Hanford Engineering Development Laboratory (Researcher), Hanford Site (Wash.) (Researcher)
Format:	Government Document Electronic eBook
Language:	English
Published:	Richland, Wash. : Oak Ridge, Tenn. : Hanford Site (Wash.) ; distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1981.
Subjects:	Annealing. Radiation Detectors. Silicon Oxides. Surface Finishing. Performance. Oxide Minerals. Quartz. Silicon Compounds. Measuring Instruments. Dielectric Track Detectors. Radiation Effects. Heat Treatments. Oxygen Compounds. Physical Radiation Effects. Minerals. Oxides. Etching. Chalcogenides. Materials Science. Instrumentation Related To Nuclear Science And Technology.

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Call Number:	E 1.99: conf-8109100-1
E 1.99: conf-8109100-1	Available