Residual stress measurments of chromium films by x-ray diffraction, the sin²psi method [electronic resource]

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Bibliographic Details
Online Access:	Online Access
Format:	Government Document Electronic eBook
Language:	English
Published:	Oak Ridge, Tenn. : distributed by the Office of Scientific and Technical Information, U.S. Dept. of Energy, 1978.
Subjects:	X-ray Diffraction. Chromium. Scattering. Diffraction. Materials Testing. Metals. High Temperature. Films. Coherent Scattering. Testing. Stresses. Strains. Residual Stresses. Elements. Transition Elements. Materials Science. Engineering.

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Call Number:	E 1.99: conf-780430-4
E 1.99: conf-780430-4	Available