Advanced Microscopy Techniques III : 15-16 May 2013, Munich, Germany / Emmanuel Beaurepaire, Peter T.C. So, editors ; sponsored by the Optical Society (United States), SPIE ; with support from Air Force Office of Scientific Research (United States), ThorLabs (United Kingdom) ; student award sponsors Toptica Photonics AG (Germany), Zeiss (United States) ; published by SPIE.

Saved in:

Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	Advanced Microscopy Techniques (Conference) Munich, Germany), Optical Society of America (sponsoring body.), SPIE (Society) (sponsoring body.), European Conference on Biomedical Optics
Other Authors:	Beaurepaire, Emmanuel (Editor), So, Peter T. C. (Editor)
Other title:	Advanced Microscopy Techniques 3. Advanced Microscopy Techniques three. SPIE digital library.
Format:	Conference Proceeding eBook
Language:	English
Published:	Bellingham, Washington : Washington, D.C. : SPIE ; The Optical Society, [2013]
Series:	Progress in biomedical optics and imaging ; v. 14, no. 47. Proceedings of SPIE--the International Society for Optical Engineering ; v. 8797.
Subjects:	Microscopy > Technique > Congresses. Microscopy > Technique. Conference papers and proceedings.

Internet

Holdings details from Online
Call Number:	QH207 .A4 2013
QH207 .A4 2013	Available