Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) / principal investigators : J. Lally and R. Meister.

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Main Authors: Lally, J. (Author), Meister, R. (Author)
Corporate Author: United States. National Aeronautics and Space Administration (sponsoring body.)
Other title:Instrumemtation and measurement of index of refraction.
Format: Government Document eBook
Language:English
Published: [Washington, D.C.] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1993.
Series:NASA contractor report ; NASA CR-175156.
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Call Number: NAS 1.26:175156
NAS 1.26:175156 Available