Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) / principal investigators : J. Lally and R. Meister.
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Main Authors: | , |
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Other title: | Instrumemtation and measurement of index of refraction. |
Format: | Government Document eBook |
Language: | English |
Published: |
[Washington, D.C.] :
Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration,
11 July 1993.
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Series: | NASA contractor report ;
NASA CR-175156. |
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Call Number: |
NAS 1.26:175156
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NAS 1.26:175156 | Available |