X-ray scattering from semiconductors and other materials / Paul F. Fewster, PANalytical Research, UK.
"This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach t...
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
Singapore ; Hackensack, NJ :
World Scientific,
[2015]
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| Edition: | 3rd edition. |
| Subjects: |
Closed Stacks - Engineering Math & Physics Library - Stacks
| Call Number: |
QC482.S3 F49 2015
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| QC482.S3 F49 2015 | Available Place a Hold |