Secondary ion mass spectrometry, SIMS-II [electronic resource] : proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979 / editors, A. Benninghoven [and others]
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| Online Access: |
Full Text (via Springer) |
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| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
New York :
Springer-Verlag,
1979.
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| Series: | Springer series in chemical physics ;
9. |
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Internet
Full Text (via Springer)Online
| Call Number: |
QD96.M3 I57 1979
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| QD96.M3 I57 1979 | Available |