APA (7th ed.) Citation

International Conference on Secondary Ion Mass Spectrometry Stanford University & Benninghoven, A. (1979). Secondary ion mass spectrometry, SIMS-II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979. Springer-Verlag.

Chicago Style (17th ed.) Citation

International Conference on Secondary Ion Mass Spectrometry Stanford University and A. Benninghoven. Secondary Ion Mass Spectrometry, SIMS-II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979. New York: Springer-Verlag, 1979.

MLA (8th ed.) Citation

International Conference on Secondary Ion Mass Spectrometry Stanford University and A. Benninghoven. Secondary Ion Mass Spectrometry, SIMS-II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979. Springer-Verlag, 1979.