The Simulation of Thermomechanically Induced Stress in Plastic Encapsulated IC Packages / by Gerard Kelly.

This book is motivated by the need to understand and predict the complex stress distributions, transfer mechanisms, warpage, and potential failures arising from the encapsulation of devices in plastic. Failures like delaminations, package cracking, and metal shift occur due to the build-up of residu...

Full description

Saved in:
Bibliographic Details
Online Access: Full Text (via Springer)
Main Author: Kelly, Gerard
Format: eBook
Language:English
Published: Boston, MA : Springer US, 1999.
Subjects:

Internet

Full Text (via Springer)

Online

Holdings details from Online
Call Number: TK7888.4
TK7888.4 Available