High-Resolution X-Ray Scattering [electronic resource] : From Thin Films to Lateral Nanostructures / by Ullrich Pietsch, Václav Holý, Tilo Baumbach.

The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structur...

Full description

Bibliographic Details

Online Access:	Full Text (via Springer)
Main Author:	Pietsch, Ullrich
Other Authors:	Holý, Václav, Baumbach, Tilo
Format:	Electronic eBook
Language:	English
Published:	New York, NY : Springer New York, 2004.
Edition:	Second edition.
Series:	Advanced texts in physics.
Subjects:	Optical materials. Nanotechnology. Surfaces (Physics)