Software Defect and Operational Profile Modeling / by Kai-Yuan Cai.

Also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1.

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Bibliographic Details
Online Access:	Full Text (via Springer)
Main Author:	Cai, Kai-Yuan
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1998.
Series:	Kluwer international series in software engineering ; 4.
Subjects:	Computer science. Software engineering. Artificial intelligence. Logic, Symbolic and mathematical.

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Full Text (via Springer)

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Call Number:	QA76.758
QA76.758	Available