Rapid Reliability Assessment of VLSICs / by A.P. Dorey, B.K. Jones, A.M.D. Richardson, Y.Z. Xu.

The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service. One possible approach that is described in this book is to make precise electrical measur...

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Bibliographic Details

Online Access:	Full Text (via Springer)
Main Author:	Dorey, A. P.
Other Authors:	Jones, B. K., Richardson, A. M. D., Xu, Y. Z.
Format:	eBook
Language:	English
Published:	Boston, MA : Springer US, 1990.
Subjects:	Engineering. Computer engineering. Optical materials.