Optical system contamination [electronic resource] : effects, measurement, control : 19-22 May 1987, Orlando, Florida / Peter Glassford, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville [and others]
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Format: | Electronic eBook |
Language: | English |
Published: |
Bellingham, Wash., USA :
The Society,
©1987.
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 777. |
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Internet
Full Text (via SPIE Digital Library)Online
Call Number: |
TL1082 .O66 1987
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TL1082 .O66 1987 | Available |