Reflection, scattering, and diffraction from surfaces IV [electronic resource] : 17-18 August 2014, San Diego, California, United States / Leonard M. Hanssen, editor ; sponsored and published by SPIE.

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Author:	SPIE (Society) (sponsoring body.)
Other Authors:	Hanssen, Leonard Matheus, 1953- (Editor)
Format:	Electronic eBook
Language:	English
Published:	Bellingham, Washington : SPIE, [2014]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 9205.
Subjects:	Surface roughness > Measurement > Congresses. Diffractive scattering > Congresses. Optical measurements > Congresses. Scattering (Physics) > Congresses. Metrology > Congresses. Diffractive scattering. Metrology. Optical measurements. Scattering (Physics) Surface roughness > Measurement. Conference papers and proceedings.

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Call Number:	TK8315 .R44 2014
TK8315 .R44 2014	Available