Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples / Lydon J. Swartzendruber.
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| Other title: | Tables for four-point probe resistivity measurements on thin, circular semiconductor samples. |
| Format: | Government Document Book |
| Language: | English |
| Published: |
Washington, D.C. :
National Bureau of Standards,
1964.
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| Series: | NBS technical note ;
199. |
| Subjects: |
Internet
Search for the full-text version of this title in HathiTrustNorlin Library - Government Information - US
| Call Number: |
C 13.46:199
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| C 13.46:199 | Available Place a Hold |