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830824s1964 dcu t f000 0 eng d |
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|a C 13.46:199
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|a C 13.46:199
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|a Swartzendruber, L. J.
|0 http://id.loc.gov/authorities/names/no2021057812.
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|a Correction factor tables for four-point probe resistivity measurements on thin, circular semiconductor samples /
|c Lydon J. Swartzendruber.
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|a Tables for four-point probe resistivity measurements on thin, circular semiconductor samples.
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| 264 |
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1 |
|a Washington, D.C. :
|b National Bureau of Standards,
|c 1964.
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| 300 |
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|a 34 pages :
|b tables ;
|c 26 cm.
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| 336 |
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|a text
|b txt
|2 rdacontent.
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| 337 |
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|a unmediated
|b n
|2 rdamedia.
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|a volume
|b nc
|2 rdacarrier.
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|a National Bureau of Standards technical note ;
|v 199.
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|a Issued April 15, 1964.
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|a GPO Historic Shelflist Project- publication not in hand.
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|a Semiconductors.
|0 http://id.loc.gov/authorities/subjects/sh85119903.
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| 650 |
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|a Electric resistance.
|0 http://id.loc.gov/authorities/subjects/sh85041986.
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| 650 |
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|a Electric resistance.
|2 fast
|0 (OCoLC)fst00905870.
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|a Semiconductors.
|2 fast
|0 (OCoLC)fst01112198.
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|a United States.
|b National Bureau of Standards.
|0 http://id.loc.gov/authorities/names/n79021148
|1 http://isni.org/isni/000000012375265X.
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| 830 |
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|a NBS technical note ;
|v 199.
|0 http://id.loc.gov/authorities/names/n42033257.
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| 856 |
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2 |
|u https://www.hathitrust.org/
|z Search for the full-text version of this title in HathiTrust
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|a .b85110760
|b 06-01-23
|c 01-27-16
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|b 01-27-16
|c r
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|a .b85110760
|b 02-09-23
|c 01-27-16
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|a MARS - RDA ENRICHED
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|p Can circulate
|a University of Colorado Boulder
|b Boulder Campus
|c Norlin
|d Norlin Library - Government Information - US
|e C 13.46:199
|h Superintendent of Documents classification
|i document
|m U183043359765
|n 1
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