Second breakdown in semiconductor devices : a bibliography / Harry A. Schafft.

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Bibliographic Details
Online Access:	Search for the full-text version of this title in HathiTrust
Main Author:	Schafft, Harry A.
Corporate Authors:	Institute for Applied Technology (U.S.), United States. National Bureau of Standards
Format:	Government Document Book
Language:	English
Published:	[Washington, D.C.] : National Bureau of Standards, 1967.
Series:	NBS technical note ; 431.
Subjects:	Semiconductor storage devices > Bibliography. Semiconductor storage devices. Bibliographies.

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Holdings details from Norlin Library - Government Information - US
Call Number:	C 13.46:427-439
C 13.46:427-439	Available Place a Hold Contents The following works are all found in the book indicated by the call number above. Studies of calibration procedures for load cells and proving rings as weighing device... The hyperbolic character of certain experimental results which tend toward limiting v... Designs for surveillance of the volt maintained by a small group of saturated standar... Compendium of ab initio calculations of molecular energies and properties / Morris Kr... Activation analysis : Cockcroft-Walton generator nuclear reactor, LINAC, July 1966 th... Second breakdown in semiconductor devices : a bibliography / Harry A. Schafft. Input/output packages for the systems 360 assembly language processor / P.A.D. DeMain... Organic chemistry : air pollution studies, characterization of chemical structures, s... Disclosures on : Autosort - an automatic collating and sorting machine, optical heter... "Life cycling" test on several strain gage pressure transducers / Paul S. Lederer. Laser-source integrating sphere reflectometer. A report to Air Force Materials Labora... Connection tables from Wiswesser chemical structure notations : a partial algorithm /...