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|a COD9
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|a C 13.46:431
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|a C 13.46:431
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|a Schafft, Harry A.
|0 http://id.loc.gov/authorities/names/n80007899
|1 http://isni.org/isni/0000000063371088.
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245 |
1 |
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|a Second breakdown in semiconductor devices :
|b a bibliography /
|c Harry A. Schafft.
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264 |
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1 |
|a [Washington, D.C.] :
|b National Bureau of Standards,
|c 1967.
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300 |
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|a 40 pages :
|b illustrations ;
|c 27 cm.
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336 |
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|a text
|b txt
|2 rdacontent.
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337 |
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|a unmediated
|b n
|2 rdamedia.
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|a volume
|b nc
|2 rdacarrier.
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490 |
1 |
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|a NBS technical note ;
|v 431.
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500 |
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|a Oct. 1967.
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500 |
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|a Electronic Instrumentation Division, Institute for Applied Technology.
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500 |
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|a GPO Historic Shelflist Project- publication not in hand.
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|a Semiconductor storage devices
|v Bibliography.
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650 |
|
7 |
|a Semiconductor storage devices.
|2 fast
|0 (OCoLC)fst01112182.
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655 |
|
7 |
|a Bibliographies.
|2 fast
|0 (OCoLC)fst01919895.
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710 |
2 |
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|a Institute for Applied Technology (U.S.)
|0 http://id.loc.gov/authorities/names/n81063070
|1 http://isni.org/isni/0000000121859656.
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710 |
1 |
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|a United States.
|b National Bureau of Standards.
|0 http://id.loc.gov/authorities/names/n79021148
|1 http://isni.org/isni/000000012375265X.
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|a NBS technical note ;
|v 431.
|0 http://id.loc.gov/authorities/names/n42033257.
|
856 |
4 |
2 |
|u https://www.hathitrust.org/
|z Search for the full-text version of this title in HathiTrust
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