Second breakdown in semiconductor devices : a bibliography / Harry A. Schafft.

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Bibliographic Details
Online Access: Search for the full-text version of this title in HathiTrust
Main Author: Schafft, Harry A.
Corporate Authors: Institute for Applied Technology (U.S.), United States. National Bureau of Standards
Format: Government Document Book
Language:English
Published: [Washington, D.C.] : National Bureau of Standards, 1967.
Series:NBS technical note ; 431.
Subjects:

MARC

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