Methods of measurement for semiconductor materials, process control, and devices : quarterly report, January 1 to March 31, 1969 / edited by W. Murray Bullis.

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Bibliographic Details
Online Access:	Search for the full-text version of this title in HathiTrust
Corporate Authors:	United States. National Bureau of Standards, Institute for Applied Technology (U.S.)
Other Authors:	Bullis, W. Murray, 1930-
Format:	Government Document Book
Language:	English
Published:	Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1969.
Series:	NBS technical note ; 488.
Subjects:	Semiconductors.

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Holdings details from Norlin Library - Government Information - US
Call Number:	C 13.46:488
C 13.46:488	Available Place a Hold