Methods of measurement for semiconductor materials, process control, and devices. : quarterly report, Oct. 1 to Dec. 31, 1970 / edited by W. Murray Bullis.

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Bibliographic Details
Corporate Authors:	United States. National Bureau of Standards, Institute for Applied Technology (U.S.). Electronic Technology Division
Other Authors:	Bullis, W. Murray, 1930-
Format:	Government Document Book
Language:	English
Published:	Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off, 1971.
Series:	NBS technical note ; 592.
Subjects:	Semiconductors.

Norlin Library - Government Information - US

Holdings details from Norlin Library - Government Information - US
Call Number:	C 13.46:592
C 13.46:592	Available Place a Hold