Fundamentals of bias temperature instability in MOS transistors : characterization methods, process and materials impact, DC and AC modeling / Souvik Mahapatra, editor.

This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based mode...

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Bibliographic Details

Online Access:	Full Text (via Springer)
Other Authors:	Mahapatra, Souvik (Editor)
Format:	eBook
Language:	English
Published:	New Delhi : Springer, [2016]
Series:	Springer series in advanced microelectronics ; v. 52.
Subjects:	Metal oxide semiconductor field-effect transistors.