Characterization of a high frequency probe assembly for integrated circuit measurement / R.L. Jesch [and] C.A. Hoer.

A detailed, applications-oriented description of a measurement technique that characterizes a high-frequency probe assembly for integrated circuit measurements is given along with the procedure that extracts the parasitic effects of the probe assembly from measurements made at the input connectors o...

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Bibliographic Details

Online Access:	Search for the full-text version of this title in HathiTrust
Main Authors:	Jesch, Ramon L., Hoer, Cletus A. (Author)
Corporate Author:	Institute for Basic Standards (U.S.). Electromagnetics Division
Format:	Government Document Book
Language:	English
Published:	[Washington, D.C.] : National Bureau of Standards, 1975.
Series:	NBS technical note ; 663.
Subjects:	Integrated circuits > Measurement. Probes (Electronic instruments)