Fault-tolerance techniques for SRAM-based FPGAs [electronic resource] / by Fernanda Lima Kastensmidt, Luigi Carro and Ricardo Reis.

Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technol...

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Bibliographic Details

Online Access:	Full Text (via Springer)
Main Author:	Kastensmidt, Fernanda Lima
Other Authors:	Carro, Luigi, Reis, Ricardo A. L. (Ricardo Augusto da Luz)
Format:	Electronic eBook
Language:	English
Published:	Dordrecht : Springer, 2006.
Series:	Frontiers in electronic testing ; 32.
Subjects:	Field programmable gate arrays. Integrated circuits > Fault tolerance.