Carrier-induced transient defect mechanism for non-radiative recombination in InGaN light-emitting devices [electronic resource]

Electronic Properties And Materials; Electronic Structure.

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Bibliographic Details
Online Access: Online Access
Corporate Author: Rensselaer Polytechnic Institute (Researcher)
Format: Government Document Electronic eBook
Language:English
Published: Washington, D.C. : Oak Ridge, Tenn. : United States. Department of Energy. ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy, 2016.
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Internet

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Online

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Call Number: E 1.99:1257833
E 1.99:1257833 Available