Carrier-induced transient defect mechanism for non-radiative recombination in InGaN light-emitting devices [electronic resource]
Electronic Properties And Materials; Electronic Structure.
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Online Access |
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Format: | Government Document Electronic eBook |
Language: | English |
Published: |
Washington, D.C. : Oak Ridge, Tenn. :
United States. Department of Energy. ; distributed by the Office of Scientific and Technical Information, U.S. Department of Energy,
2016.
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Internet
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Call Number: |
E 1.99:1257833
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E 1.99:1257833 | Available |