The SIMS technique applied to background suppression / George A. Vanasse, Roy W. Esplin, Ronald J. Huppi.

A method of using the SIMS (the selective modulation interferometric spectrometer) to measure the difference between the spectral content of two optical beams is given. The differencing is done optically; that is, the modulated director signal is directly proportional to the difference between the t...

Full description

Saved in:
Bibliographic Details
Online Access: Search for the full-text version of this title in HathiTrust
Main Authors: Vanasse, George A. (Author), Esplin, Roy W. (Author), Huppi, Ronald J. (Author)
Corporate Author: U.S. Air Force Geophysics Laboratory
Format: Government Document Book
Language:English
Published: Hanscom AFB, Massachusetts : Air Force Geophysics Laboratory, Air Force Systems Command, United States Air Force, 1978.
Series:AFGL-TR ; 78-0222.
Instrumentation papers ; no. 270.
Subjects:

Internet

Search for the full-text version of this title in HathiTrust

PASCAL Offsite

Holdings details from PASCAL Offsite
Call Number: D 301.45/10:270
D 301.45/10:270 Available Place a Hold