Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI [electronic resource] : 23-24 January 2012, San Francisco, California, United States / Sonia M. Garcia-Blanco, Rajeshuni Ramesham, editors ; sponsored by SPIE ; cosponsored by Dyoptyka (Ireland) [and] VUZIX Corporation ; cooperating organization, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)
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Full Text (via SPIE Digital Library) |
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| Corporate Authors: | , , , |
| Other Authors: | , |
| Other title: | SPIE digital library. |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Bellingham, Wash. :
SPIE,
©2012.
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 8250. |
| Subjects: |
Internet
Full Text (via SPIE Digital Library)Online
| Call Number: |
TK7875 .R44 2012e
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| TK7875 .R44 2012e | Available |