Optical test and measurement technology and equipment [electronic resource] : 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 26-29 April 2012, Xiamen, China / Yudong Zhang, Libin Xiang, Sandy To, editors ; sponsored by COS--the Chinese Optical Society (China) [and] IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), National Natural Science Foundation of China (China)

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Bibliographic Details
Online Access:	Full Text (via SPIE Digital Library)
Corporate Authors:	International Symposium on Advanced Optical Manufacturing and Testing Technologies Xiamen Shi, China, Zhongguo guang xue xue hui, Zhongguo ke xue yuan. Guang dian ji shu yan jiu suo, SPIE (Society), Guo jia zi ran ke xue ji jin wei yuan hui (China), China. Guo jia ke xue ji shu bu, Zhongguo ke xue yuan
Other Authors:	Zhang, Yudong, Xiang, Libin, To, Sandy
Other title:	6th International Symposium on Advanced Optical Manufacturing and Testing Technologies. Sixth International Symposium on Advanced Optical Manufacturing and Testing Technologies. International Symposium on Advanced Optical Manufacturing and Testing Technologies. SPIE digital library.
Format:	Electronic Conference Proceeding eBook
Language:	English
Published:	Bellingham, WA : SPIE, ©2012.
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 8417.
Subjects:	Optical materials > Testing > Congresses. Optical measurements > Congresses. Measurement > Congresses. Measurement. Optical materials > Testing. Optical measurements. Conference papers and proceedings.

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Call Number:	QC374 .I5833 2012e
QC374 .I5833 2012e	Available