Ultra clean processing of semiconductor surfaces XII : selected, peer reviewed papers from the 12th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS) September 21-24, 2014, Brussels, Belgium / edited by Paul Mertens, Marc Meuris and Marc Heyns.

Collection of selected, peer reviewed papers from the 12th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), September 21-24, 2014, Brussels, Belgium. The 71 papers are grouped as follows: Chapter 1: Cleaning for FEOL Applications, Chapter 2: Cleaning for FEOL Appl...

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Online Access: Full Text (via ProQuest)
Corporate Author: International Symposium on Ultra Clean Processing of Semiconductor Surfaces Brussels, Belgium
Other Authors: Mertens, Paul (Editor), Meuris, Marc (Editor), Heyns, Marc (Editor)
Format: Conference Proceeding eBook
Language:English
Published: Pfaffikon, Switzerland : TTP, 2014.
Series:Diffusion and defect data. Solid state phenomena ; v. 219.
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Summary:Collection of selected, peer reviewed papers from the 12th International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS), September 21-24, 2014, Brussels, Belgium. The 71 papers are grouped as follows: Chapter 1: Cleaning for FEOL Applications, Chapter 2: Cleaning for FEOL Applications: Beyond-Si Active Area, Chapter 3: Wet Etching for FEOL Applications, Chapter 4: Wet Processing of High Aspect Ratio Structures, Chapter 5: Fluid Dynamics, Cleaning Mechanics, Chapter 6: Photo Resist Performance and Rework, Chapter 7: Cleaning for BEOL Interconnect Applications, Chapter 8: Cleaning for 3D Applications, Chapter 9: Contamination Control and AMC, Chapter 10: Cleaning and Wet Etching for Semiconductor Photo-Voltaic Cells Keyword: Ultra-cleaning, precision cleaning, wet cleaning, Semiconductor Surfaces, contamination control, surface impurities, surface defects, Integrated circuits, Micro-electronic structures, photovoltaic processing, proceedings UCPSS.
Physical Description:1 online resource (331 pages) : illustrations.
Bibliography:Includes bibliographical references at the end of each chapters and index.
ISBN:9783038266266
3038266264
ISSN:1662-7799 ;
Language:English.
Source of Description, Etc. Note:Online resource; title from PDF title page (ebrary, viewed October 16, 2014)