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Stress Induced Phenomena in Metallization : 5th International Workshop, Stuttgart, Germany, June 23-25, 1999.

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Bibliographic Details
Online Access:	Full Text (via Scitation)
Other Authors:	Kraft, Oliver (Editor), Arzt, Eduard (Editor), Volkert, Cynthia A. (Editor), Ho, Paul S. (Editor), Okabayashi, Hidekazu (Editor)
Format:	eBook
Language:	English
Published:	College Park : Secaucus : American Institute of Physics, Springer [distributor] Oct. 1999 ;
Series:	AIP Conference Proceedings Ser. ; vol. 491.
Subjects:	Integrated circuits > Defects > Congresses. Thin film devices > Defects > Congresses. Electrodiffusion > Congresses. Metallic films > Congresses. Electrochemical metallizing > Congresses. Aluminum films > Congresses. Semiconductors > Defects > Congresses. Liquid crystal devices > Defects > Congresses. Acoustic surface wave devices > Defects > Congresses. Aluminum films. Electrochemical metallizing. Electrodiffusion. Integrated circuits > Defects. Metallic films. Semiconductors > Defects. Thin film devices > Defects. Conference papers and proceedings.

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Call Number:	TK7871.85 .S773 1999
TK7871.85 .S773 1999	Available