High temperature strain measurement with a resistance strain gage [microform] [microform] / Jih-Fen Lei and Ed Fichtel and Amos McDaniel.

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Bibliographic Details
Main Author:	Lei, Jih-Fen
Corporate Author:	United States. National Aeronautics and Space Administration
Other Authors:	Fichtel, Edward J., McDaniel, Amos D.
Format:	Government Document Microfilm Book
Language:	English
Published:	[Washington, DC] : [Springfield, Va.] : National Aeronautics and Space Administration ; [National Technical Information Service, distributor], [1993]
Series:	NASA contractor report ; NASA CR-194441.
Subjects:	High temperatures. Strains and stresses.

Norlin Library - Government Information - Microform

Holdings details from Norlin Library - Government Information - Microform
Call Number:	NAS 1.26:194441
NAS 1.26:194441	Restricted Place a Hold