Contamination-free manufacturing for semiconductors and other precision products / edited by Robert P. Donovan.

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Bibliographic Details
Other Authors:	Donovan, R. P.
Format:	Book
Language:	English
Published:	New York : Marcel Dekker, ©2001.
Subjects:	Semiconductors > Design and construction. Semiconductors > Defects.

Closed Stacks - Engineering Math & Physics Library - Stacks

Holdings details from Closed Stacks - Engineering Math & Physics Library - Stacks
Call Number:	TK7871.85 .C6175 2001
TK7871.85 .C6175 2001	Withdrawn